Application: Nuclear Event Detectors (NEDs) are used to initiate circumvention following the occurrence of a nuclear blast.
Related parts:
- Circumvention Clamp, NT-Clamp-3001. The Circumvention Clamp is used to remove power from electronic circuits following the occurance of a nuclear blast. It is typically triggered by a combination of NEDs and circuit logic.
- Dual MOSFET Driver, NT-Driver-4001. It is used to drive power MOSFETs in circuits that are required to operate in a nuclear environment.
NED block diagram. The sensor banks and most of the electronics are redundant. This gives the part a high degree of SEE immunity.
Key features:
- Trip threshold: 1.5 E6-2E8 rad(Si)/s.
- 1/15 the volume of existing parts.
- 1st (and only) monolithic NED. Transistors are used to detect the radiation. Enables reduction in NED volume.
- Redundant, single event effects (SEE) immune design.
- Comprehensive built in test (BIT) including:
- Sensor checkout
- Checkout of entire part
- Trip threshold calibration
- BIT will not self trigger during flight
- Rad-hard.
The Circumvention Clamp is offered in a 14-pin ceramic package. Size is .225"x.225"x.06".
Benefits:
- Reduced volume enables compact systems and distributed circumvention.
- SEE immunity prevents false positives due to natural space radiation.
- Quantitative BIT reduces costs associated with system qualification and maintenance.
Status: The Monolithic NED has been fabricated and tested electrically and with radiation. Additional tests are planned in late 2009 and early 2010.
Available for purchase:
Subject to ITAR control: Yes
The Monolithic NED has been inserted in the Common IMU being developed by Kearfott Corporation. The Kearfott Common IMU (KCIMU) will be part of MDA/DEP 2010 and 2011 Flight Experiments.
Additional Information will be provided upon request.
