Application: Circumvention Clamp, NT-Clamp-3001. The Circumvention Clamp is used to remove power from electronic circuits, following the occurrence of a nuclear blast. It is typically triggered by a combination of NEDs and circuit logic.

Related parts:

• Monolithic NED, NT-NED-1001. Nuclear Event Detectors (NEDs) are used to initiate circumvention, following the occurrence of a nuclear blast.
• Dual MOSFET Driver, NT-Driver-4001. It is used to drive power MOSFETs in circuits that are required to operate in a nuclear environment.

Key features:

• First monolithic circumvention clamp. Provides an alternative to in-house discrete designs.
• Two modes of operation:
  • Externally triggered, using external NEDs and logic.
  • Self triggered, using internal sensors to detect the nuclear event.
• Output will switch a 2 nF load at 20 V/μs. A power MOSFET can be added to increase switched load.
• A 500 ns pulse stretcher provides a positive output, which turns on an N-Channel FET after an event or input. An equivalent negative pulse turns on a P-Channel FET. A longer pulse is available using an external capacitor.
• Rad-hard.

 The Circumvention Clamp is offered in a 14-pin ceramic package. Size is .225"x.225"x.06".

Benefits:

• In self-triggered mode Circumvention Clamp doubles as an NED.
• Replaces many discrete parts for a highly compact design.

Status: The Circumvention Clamp has been fabricated and tested electrically and with radiation. Additional tests are planned in late 2009 and early 2010.

Available for purchase:

• Die
• Packaged parts

Subject to ITAR control: Yes

Additional Information will be provided upon request.